Thursday, May 15, 2014

High Speed IO Eye Diagram Test for USB and Ethernet

This measurement is also called the High Speed IO EYE diagram or High Speed IO signal integrity test. The device must be capable of sending the Test_Packet pattern in order to perform the High Speed IO EYE diagram test. The product can be forced into test mode with the USBHSET tool for devices, hubs and standard host and the High Speed Embedded Host Tester for Embedded Hosts and OTG products. 

When a High Speed product has a standard, mini or micro receptacle the EYE diagram measurement is performed near-end. A High Speed test SMA fixture is required in order to do the tests. The 50 Ohm SMA cables are connected directly to the scope where the fixture compensate to 45Ohm. The distance from the device to the fixture should be kept as short as possible and therefore require very short cables or adapters. The official fixture can be puchased via USB-IF eStore.

If a device has a captive cable, vendor specific cable or direct A-plug the measurement is done far end. The EYE is smaller as the near end eye and therefore more relax the pass/fail criteria on the eye. Note that Thumbdrives also consider to have a captive cable.

Our company Bifrost Tech provide a complete High Speed IO Eye Diagram Tester for USB and Ethernet for Production Environment which proven 10x faster than scope. Contact us at support@bifrostech.com for further detail.